검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections Scheithauer U Applied Surface Science, 179(1-4), 20, 2001 |
| 2 |
Positron beam studies of defects in semiconductors Krause-Rehberg R, Borner F, Redmann F Materials Science Forum, 363-3, 404, 2001 |