검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Evaluation strategies for multi-layer, multi-material ellipsometric measurements Polgar O, Petrik R, Lohner T, Fried M Applied Surface Science, 253(1), 57, 2006 |
| 2 |
Real-time optical control of Ga1-xInxP film growth by p-polarized reflectance Dietz N, Woods V, Ito K, Lauko I Journal of Vacuum Science & Technology A, 17(4), 1300, 1999 |