화학공학소재연구정보센터
검색결과 : 228건
No. Article
1 Subthreshold behavior of junctionless silicon nanowire transistors from atomic scale simulations
Ansari L, Feldman B, Fagas G, Colinge JP, Greer JC
Solid-State Electronics, 71, 58, 2012
2 Reverse graded strain relaxed SiGe buffers for CMOS and optoelectronic integration
Shah VA, Dobbie A, Myronov M, Leadley DR
Thin Solid Films, 520(8), 3227, 2012
3 Metal-Free Disordered Vertical Sub-Micron Silicon Wires Produced from Electrochemical p-Type Porous Silicon Layers
Gautier G, Defforge T, Kouassi S, Coudron L
Electrochemical and Solid State Letters, 14(8), D81, 2011
4 Formation of p-Silicon Wire by Electrochemical Etching Using Positive Photoresist as an Etch Mask in Organic Electrolyte
Jang HS, Choi HJ, Kang SM
Electrochemical and Solid State Letters, 14(8), D84, 2011
5 Die-to-Die Adhesive Bonding Procedure for Evanescently-Coupled Photonic Devices
Stankovic S, Jones R, Heck J, Sysak M, Van Thourhout D, Roelkens G
Electrochemical and Solid State Letters, 14(8), H326, 2011
6 Electronic Structure and Photovoltaic Properties of n-Type Amorphous In-Ga-Zn-O and p-Type Single Crystal Si Heterojunctions
Lee K, Nomura K, Yanagi H, Kamiya T, Hosono H
Electrochemical and Solid State Letters, 14(8), H346, 2011
7 Low-Voltage Poly-Si TFTs with Solution-Processed Aluminum Oxide Gate Dielectric
Kang I, Avis C, Kang DH, Jang J
Electrochemical and Solid State Letters, 14(8), J51, 2011
8 Aqueous, Room Temperature Electrochemical Deposition of Compact Si Films
Krishnamurthy A, Rasmussen DH, Suni II
Electrochemical and Solid State Letters, 14(9), D99, 2011
9 Visualization of Single Atomic Steps on An Ultra-Flat Si(100) Surface by Advanced Differential Interference Contrast Microscopy
Kobayashi SI, Kim YG, Wen R, Yasuda K, Fukidome H, Suwa T, Kuroda R, Li X, Teramoto A, Ohmi T, Itaya K
Electrochemical and Solid State Letters, 14(9), H351, 2011
10 Impact of Forming Gas Annealing and Firing on the Al2O3/p-Si Interface State Spectrum
Simoen E, Rothschild A, Vermang B, Poortmans J, Mertens R
Electrochemical and Solid State Letters, 14(9), H362, 2011