검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
An improved method for determining the critical energy for interface trap generation of n-MOSFETs under V-g = V-d/2 stress mode Mu FC, Mao LF, Wei JL, Tan CH, Xu MZ Solid-State Electronics, 45(3), 385, 2001 |
| No. | Article |
|---|---|
| 1 |
An improved method for determining the critical energy for interface trap generation of n-MOSFETs under V-g = V-d/2 stress mode Mu FC, Mao LF, Wei JL, Tan CH, Xu MZ Solid-State Electronics, 45(3), 385, 2001 |