검색결과 : 18건
No. | Article |
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1 |
Surface microstructure and B2 phase structural state induced in NiTi alloy by a high-current pulsed electron beam Meisner LL, Ostapenko MG, Lotkov AI, Neiman AA Applied Surface Science, 324, 44, 2015 |
2 |
Cross-sectional TEM analysis of structural phase states in TiNi alloy treated by a low-energy high-current pulsed electron beam Neiman AA, Meisner LL, Lotkov AI, Koval NN, Semin VO, Teresov AD Applied Surface Science, 327, 321, 2015 |
3 |
Ge nanocrystals embedded in a GeOx matrix formed by thermally annealing of Ge oxide films Vijayarangamuthu K, Rath S, Kabiraj D, Avasthi DK, Kulriya PK, Singh VN, Mehta BR Journal of Vacuum Science & Technology A, 27(4), 731, 2009 |
4 |
Contrast reversal effect in scanning electron microscopy due to charging Abe H, Babin S, Borisov S, Hamaguchi A, Kadowaki M, Miyano Y, Yamazaki Y Journal of Vacuum Science & Technology B, 27(3), 1039, 2009 |
5 |
Evaluation of each electron beam and exposure results with four column cells in multicolumn e-beam exposure system Yamada A, Yasuda H, Yamabe M Journal of Vacuum Science & Technology B, 27(6), 2518, 2009 |
6 |
Understanding of hydrogen silsesquioxane electron resist for sub-5-nm-half-pitch lithography Yang JKW, Cord B, Duan HG, Berggren KK, Klingfus J, Nam SW, Kim KB, Rooks MJ Journal of Vacuum Science & Technology B, 27(6), 2622, 2009 |
7 |
High rate gas dosing for tip based nanofabrication processes Kanouff MP, Randall JN, Nadesalingham M, Kirk WP, Wallace RM Journal of Vacuum Science & Technology B, 27(6), 2769, 2009 |
8 |
Electron beams in individual column cells of multicolumn cell system Yamada A, Yasuda H, Yamabe M Journal of Vacuum Science & Technology B, 26(6), 2025, 2008 |
9 |
Prospects of free electron analog to digital technology Aldana R, Pease RF Journal of Vacuum Science & Technology B, 26(6), 2592, 2008 |
10 |
Atomic-scale field emitter with self-repairable function and thermodynamically stable structure: FEM study on Pd-covered nanopyramids on W < 1 1 1 > tips Rokuta E, Itagaki T, Miura D, Moriyama T, Ishikawa T, Cho BL, Fu TY, Tsong TT, Oshima C Applied Surface Science, 251(1-4), 205, 2005 |