검색결과 : 16건
No. | Article |
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1 |
A detailed study on the Fe-doped TiO2 thin films induced by pulsed laser deposition route Meng LJ, Wang ZH, Yang L, Ren WJ, Liu W, Zhang ZD, Yang T, dos Santos MP Applied Surface Science, 474, 211, 2019 |
2 |
Recombinant protein production by engineered Escherichia coli in a pressurized airlift bioreactor: A techno-economic analysis Campani G, dos Santos MP, da Silva GG, Horta ACL, Badino AC, Giordano RD, Goncalves VM, Zangirolami TC Chemical Engineering and Processing, 103, 63, 2016 |
3 |
Periodic current oscillations observed in organic MIM junctions Dos Santos MP, Bonfim TS, Guimaraes JG, Ceschin AM Journal of Materials Science, 45(18), 4986, 2010 |
4 |
The effect of the ion beam energy on the properties of indium tin oxide thin films prepared by ion beam assisted deposition Meng LJ, Gao J, Dos Santos MP, Wang X, Wang T Thin Solid Films, 516(7), 1365, 2008 |
5 |
Thermal behavior of vanadyl complexes with Schiff bases derived from trans-N,N'-bis(salicylidene)-1,2-cyclohexadiamine (t-Salcn) Aranha PE, Souza JM, Romera S, Ramos LA, dos Santos MP, Dockal ER, Cavalheiro ETG Thermochimica Acta, 453(1), 9, 2007 |
6 |
A study of the optical properties of titanium oxide films prepared by dc reactive magnetron sputtering Meng LJ, Teixeira V, Cui HN, Placido F, Xu Z, dos Santos MP Applied Surface Science, 252(22), 7970, 2006 |
7 |
Optical and structural properties of vanadium pentoxide films prepared by d.c. reactive magnetron sputtering Meng LJ, Silva RA, Cui HN, Teixeira V, dos Santos MP, Xu Z Thin Solid Films, 515(1), 195, 2006 |
8 |
Residual stress effects on Raman spectra of RuO2 thin films Meng LJ, Silva R, Cui HN, Teixeira V, dos Santos MP Materials Science Forum, 490-491, 583, 2005 |
9 |
Raman spectroscopy analysis of magnetron sputtered RuO2 thin films Meng LJ, Teixeira V, dos Santos MP Thin Solid Films, 442(1-2), 93, 2003 |
10 |
Influence of sputtering pressure on the structure and properties of ZrO2 films prepared by rf reactive sputtering Gao PT, Meng LJ, dos Santos MP, Teixeira V, Andritschky M Applied Surface Science, 173(1-2), 84, 2001 |