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| No. | Article |
|---|---|
| 1 |
X-ray CTR scattering measurement of InP/InGaAs/InP interface structures fabricated by different growth processes Tabuchi M, Takahashi R, Araki M, Hirayama K, Futakuchi N, Shimogaki Y, Nakano Y, Takeda Y Applied Surface Science, 159, 250, 2000 |