검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
"Layer-Filter Threshold" Technique for Near-Infrared Laser Ablation in Organic Semiconductor Device Processing Ye F, Chen ZB, Zhao XL, Chen JY, Yang XN Advanced Functional Materials, 25(28), 4453, 2015 |
| 2 |
In situ spatial-profile monitoring of beam flux of neutral free radicals produced by photo-deionization of negative ion beams Hayashi K, Tanaka D, Araki H, Maruyama T, Matsumura D, Toyoda K, Tsuji N Applied Surface Science, 255(24), 9581, 2009 |
| 3 |
Photoluminescence mapping of a SiC wafer in device processing Tajima M, Sugahara T, Hoshino N, Tanimoto S, Takahashi T, Nakashima S, Yamamoto T Materials Science Forum, 457-460, 569, 2004 |
| 4 |
Vertically integrated computer-aided design for device processing Makabe T, Maeshige K Applied Surface Science, 192(1-4), 176, 2002 |