검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Spectral artefacts post sputter-etching and how to cope with them - A case study of XPS on nitride-based coatings using monoatomic and cluster ion beams Lewin E, Counsell J, Patscheider J Applied Surface Science, 442, 487, 2018 |
| 2 |
The new mechanism of sputtering with cluster ion beams Chernysh VS, Ieshkin AE, Ermakov YA Applied Surface Science, 326, 285, 2015 |
| 3 |
A comparative study of secondary ion yield from model biological membranes using Au-n(+) and C-60(+) primary ion sources Baker MJ, Fletcher JS, Jungnickel H, Lockyer NP, Vickerman JC Applied Surface Science, 252(19), 6731, 2006 |
| 4 |
ToF-SIMS analysis of bio-systems: Are polyatomic primary ions the solution? Jones EA, Fletcher JS, Thompson CE, Jackson DA, Lockyer NP, Vickerman JC Applied Surface Science, 252(19), 6844, 2006 |
| 5 |
Performance of a C-60(+) ion source on a dynamic SIMS instrument Fahey AJ, Gillen G, Chi P, Mahoney CM Applied Surface Science, 252(19), 7312, 2006 |