검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
The defect-centric perspective of device and circuit reliability-From gate oxide defects to circuits Kaczer B, Franco J, Weckx P, Roussel PJ, Simicic M, Putcha V, Bury E, Cho M, Degraeve R, Linten D, Groeseneken G, Debacker P, Parvais B, Raghavan P, Catthoor F, Rzepa G, Waltl M, Goes W, Grasser T Solid-State Electronics, 125, 52, 2016 |
| 2 |
Modeling of MOSFET parasitic capacitances, and their impact on circuit performance Mueller J, Thoma R, Demircan E, Bernicot C, Juge A Solid-State Electronics, 51(11-12), 1485, 2007 |