검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterization of SOI wafers by X-ray CTR scattering Shimura T, Hosoi T, Umeno M Journal of Crystal Growth, 210(1-3), 98, 2000 |
| No. | Article |
|---|---|
| 1 |
Characterization of SOI wafers by X-ray CTR scattering Shimura T, Hosoi T, Umeno M Journal of Crystal Growth, 210(1-3), 98, 2000 |