검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry Evans WR, Allred DD Thin Solid Films, 515(3), 847, 2006 |
| No. | Article |
|---|---|
| 1 |
Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry Evans WR, Allred DD Thin Solid Films, 515(3), 847, 2006 |