1 |
Effects of yttrium doping on the electrical performances and stability of ZnO thin-film transistors Abliz A, Xu L, Wan D, Duan HM, Wang JL, Wang CL, Luo SJ, Liu CS Applied Surface Science, 475, 565, 2019 |
2 |
Enhanced gate-bias stress stability of organic field-effect transistors by introducing a fluorinated polymer in semiconductor/insulator ternary blends Jeong YJ, Yun DJ, Nam S, Jang J Applied Surface Science, 481, 642, 2019 |
3 |
Bias-stress effects in diF-TES-ADT field-effect transistors Kim CH Solid-State Electronics, 153, 23, 2019 |
4 |
Overcoating BaTiO3 dielectrics with a fluorinated polymer to produce highly reliable organic field-effect transistors Jeong YJ, Kim DH, Kang YM, An TEY Thin Solid Films, 685, 40, 2019 |
5 |
Role of AlGaN/GaN interface traps on negative threshold voltage shift in AlGaN/GaN HEMT Malik A, Sharma C, Laishram R, Bag RK, Rawal DS, Vinayak S, Sharma RK Solid-State Electronics, 142, 8, 2018 |
6 |
Universal model of bias-stress-induced instability in inkjet-printed carbon nanotube networks field-effect transistors Jung H, Choi S, Jang JT, Yoon J, Lee J, Lee Y, Rhee J, Ahn G, Yu HR, Kim DM, Choi SJ, Kim DH Solid-State Electronics, 140, 80, 2018 |
7 |
Extraction method of trap densities for indium zinc oxide thin-film transistors processed by solution method Qiang L, Liang XC, Pei YL, Yao RH, Wang G Thin Solid Films, 649, 51, 2018 |
8 |
Cycle of charge carrier states with formation and extinction of a floating gate in an ambipolar tetracyanoquaterthienoquinoid-based field-effect transistor Itoh T, Toyota T, Higuchi H, Matsushita MM, Suzuki K, Sugawara T Chemical Physics Letters, 671, 71, 2017 |
9 |
Bias stress effects in pentacene thin-film transistors with poly(methyl methacrylate) gate insulator Kim DK, Lee H, Ham Y, Park J, Bae JH Molecular Crystals and Liquid Crystals, 645(1), 36, 2017 |
10 |
Carrier trapping anisotropy in ambipolar SnO thin-film transistors Luo H, Liang LY, Cao HT Solid-State Electronics, 129, 88, 2017 |