| 1 |
Consolidation behaviour of Cu/AlN composites by pulse electric current sintering of copper-coated aluminium nitride precursors
Ramirez-Vinasco D, Leon-Patino CA, Nanko M, Aguilar-Reyes EA
Powder Technology, 377, 723, 2021 |
| 2 |
Nitridation and hydrogen reduction of Fe-2.3 wt% Al alloy powder
Yadav AS, Kurnsteiner P, Jagle EA, Meka SR
Powder Technology, 374, 527, 2020 |
| 3 |
Morphology and element composition profiles of alumina films obtained by mixed thermal oxidation of AlN epitaxial layers
Domanowska A, Korbutowicz R, Teterycz H
Applied Surface Science, 484, 1234, 2019 |
| 4 |
First-principles calculations of aluminium nitride monolayer with chemical functionalization
Wang SK, Tian HY, Luo Y, Yu J, Ren CD, Sun CL, Xu YJ, Sun ML
Applied Surface Science, 481, 1549, 2019 |
| 5 |
Initial stages of the epitaxial growth of AlN on GaN (111)-(2 x 2) surface: Ab-initio studies
Moreno JC, Camacho-Garcia JH, Ponce-Perez R, Sanchez-Ochoa F, De la Cruz MTR, Cocoletzi GH
Journal of Crystal Growth, 507, 370, 2019 |
| 6 |
Thin films composed of metal nanoparticles (Au, Ag, Cu) dispersed in AlN: The influence of composition and thermal annealing on the structure and plasmonic response
Domingues RP, Rodrigues MS, Lopes C, Pedrosa P, Alves E, Barradas NP, Borges J, Vaz F
Thin Solid Films, 676, 12, 2019 |
| 7 |
Effect of AlN layer on the resistive switching properties of TiO2 based ReRAM memory devices
Rathore BPS, Prakash R, Kaur D
Current Applied Physics, 18(1), 102, 2018 |
| 8 |
Thermodynamic evaluation of nucleation as a method for selection of aluminium nitride modifications
Kudyakova VS, Shishkin RA, Zykov FM, Zvonarev KV, Chukin AV, Polyakov EV, Beketov AR
Journal of Crystal Growth, 486, 111, 2018 |
| 9 |
Electrical and structural characteristics of sputtered c-oriented AlN thin films on Si (100) and Si (110) substrates
Pandey A, Kaushik J, Dutta S, Kapoor AK, Kaur D
Thin Solid Films, 666, 143, 2018 |
| 10 |
Silicon induced defect reduction in AN template layers for epitaxial lateral overgrowth
Mogilatenko A, Knauer A, Zeimer U, Hartmann C, Oppermann H, Weyers M
Journal of Crystal Growth, 462, 18, 2017 |
