검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Ti diffusion in chalcogenides: a ToF-SIMS depth profile characterization approach Alberici SG, Zonca R, Pashmakov B Applied Surface Science, 231-2, 821, 2004 |
| 2 |
High quality thin oxynitride by RTP annealing of in situ steam generation oxides for flash memory applications Brazzelli D, Ghidini G, Crivelli B, Zonca R, Bersani M Solid-State Electronics, 45(8), 1271, 2001 |
| 3 |
Surface characterization by photocurrent measurements Polignano ML, Caricato AP, Modelli A, Zonca R Applied Surface Science, 154, 276, 2000 |
| 4 |
A novel method for the simultaneous characterization of bulk impurities and surface states by photocurrent measurements Polignano ML, Caricato AP, Modelli A, Zonca R Journal of the Electrochemical Society, 147(4), 1577, 2000 |
| 5 |
Kinetic modeling and dopant effect on silicon deposition - Low pressure and plasma assisted chemical vapor deposition Masi M, Zonca R, Carra S Journal of the Electrochemical Society, 146(1), 103, 1999 |
| 6 |
Nitridation of thin gate or tunnel oxides by nitric oxide Gerardi C, Zonca R, Crivelli B, Alessandri M Journal of the Electrochemical Society, 146(8), 3058, 1999 |
| 7 |
Surface recombination velocity from photocurrent measurements -Validation and applications Polignano ML, Bellafiore N, Caputo D, Caricato AP, Modelli A, Zonca R Journal of the Electrochemical Society, 146(12), 4640, 1999 |