검색결과 : 11건
No. | Article |
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1 |
Structural and electrical properties of Ge-on-Si(001) layers with ultra heavy n-type doping grown by MBE Yurasov DV, Antonov AV, Drozdov MN, Yunin PA, Andreev BA, Bushuykin PA, Baydakova NA, Novikov AV Journal of Crystal Growth, 491, 26, 2018 |
2 |
Investigation of boron incorporation in delta doped diamond layers by secondary ion mass spectrometry Lobaev MA, Gorbachev AM, Vikharev AL, Isaev VA, Radishev DB, Bogdanov SA, Drozdov MN, Yunin PA, Butler JE Thin Solid Films, 653, 215, 2018 |
3 |
Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures Drozdov MN, Drozdov YN, Chkhalo NI, Polkovnikov VN, Yunin PA, Chirkin MV, Gololobov GP, Suvorov DV, Fu DJ, Pelenovich V, Tolstogouzov A Thin Solid Films, 661, 65, 2018 |
4 |
Antimony segregation and n-type doping in Si/Si(111) films grown by molecular beam epitaxy Yurasov DV, Drozdov MN, Schmagin VB, Yunin PA, Novikov AV Journal of Crystal Growth, 475, 291, 2017 |
5 |
Novel hybrid materials based on the vanadium oxide nanobelts Zabrodina GS, Makarov SG, Kremlev KV, Yunin PA, Gusev SA, Kaverin BS, Kaverina LB, Ketkov SY Applied Surface Science, 368, 395, 2016 |
6 |
Ultrathin metallic interlayers in vacuum deposited MoOx/metal/MoOx electrodes for organic solar cells Travkin VV, Luk'yanov AY, Drozdov MN, Vopilkin EA, Yunin PA, Pakhomov GL Applied Surface Science, 390, 703, 2016 |
7 |
Characterization of interfaces in mosaic CVD diamond crystal Muchnikov AB, Radishev DB, Vikharev AL, Gorbachev AM, Mitenkin AV, Drozdov MN, Drozdov YN, Yunin PA Journal of Crystal Growth, 442, 62, 2016 |
8 |
Grazing incidence mirrors with enhanced reflectance in the soft X-ray region Chkhalo NI, Gaikovich PK, Salashchenko NN, Yunin PA, Zuev SY Thin Solid Films, 598, 156, 2016 |
9 |
Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Drozdov MN, Drozdov YN, Csik A, Novikov AV, Vad K, Yunin PA, Yurasov DV, Belykh SF, Gololobov GP, Suvorov DV, Tolstogouzov A Thin Solid Films, 607, 25, 2016 |
10 |
Recovery of SIMS depth profiles with account for nonstationary effects Yunin PA, Drozdov YN, Drozdov MN, Yurasova DV Applied Surface Science, 307, 33, 2014 |