화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Structural and electrical properties of Ge-on-Si(001) layers with ultra heavy n-type doping grown by MBE
Yurasov DV, Antonov AV, Drozdov MN, Yunin PA, Andreev BA, Bushuykin PA, Baydakova NA, Novikov AV
Journal of Crystal Growth, 491, 26, 2018
2 Investigation of boron incorporation in delta doped diamond layers by secondary ion mass spectrometry
Lobaev MA, Gorbachev AM, Vikharev AL, Isaev VA, Radishev DB, Bogdanov SA, Drozdov MN, Yunin PA, Butler JE
Thin Solid Films, 653, 215, 2018
3 Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures
Drozdov MN, Drozdov YN, Chkhalo NI, Polkovnikov VN, Yunin PA, Chirkin MV, Gololobov GP, Suvorov DV, Fu DJ, Pelenovich V, Tolstogouzov A
Thin Solid Films, 661, 65, 2018
4 Antimony segregation and n-type doping in Si/Si(111) films grown by molecular beam epitaxy
Yurasov DV, Drozdov MN, Schmagin VB, Yunin PA, Novikov AV
Journal of Crystal Growth, 475, 291, 2017
5 Novel hybrid materials based on the vanadium oxide nanobelts
Zabrodina GS, Makarov SG, Kremlev KV, Yunin PA, Gusev SA, Kaverin BS, Kaverina LB, Ketkov SY
Applied Surface Science, 368, 395, 2016
6 Ultrathin metallic interlayers in vacuum deposited MoOx/metal/MoOx electrodes for organic solar cells
Travkin VV, Luk'yanov AY, Drozdov MN, Vopilkin EA, Yunin PA, Pakhomov GL
Applied Surface Science, 390, 703, 2016
7 Characterization of interfaces in mosaic CVD diamond crystal
Muchnikov AB, Radishev DB, Vikharev AL, Gorbachev AM, Mitenkin AV, Drozdov MN, Drozdov YN, Yunin PA
Journal of Crystal Growth, 442, 62, 2016
8 Grazing incidence mirrors with enhanced reflectance in the soft X-ray region
Chkhalo NI, Gaikovich PK, Salashchenko NN, Yunin PA, Zuev SY
Thin Solid Films, 598, 156, 2016
9 Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry
Drozdov MN, Drozdov YN, Csik A, Novikov AV, Vad K, Yunin PA, Yurasov DV, Belykh SF, Gololobov GP, Suvorov DV, Tolstogouzov A
Thin Solid Films, 607, 25, 2016
10 Recovery of SIMS depth profiles with account for nonstationary effects
Yunin PA, Drozdov YN, Drozdov MN, Yurasova DV
Applied Surface Science, 307, 33, 2014