검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Cu Contamination of the nMOSFET in a 3-D Integrated Circuit under Thermal and Electrical Stress Yeon HW, Jung SY, Lim JR, Pyun J, Kim H, Baek D, Joo YC Electrochemical and Solid State Letters, 15(5), H157, 2012 |
| No. | Article |
|---|---|
| 1 |
Cu Contamination of the nMOSFET in a 3-D Integrated Circuit under Thermal and Electrical Stress Yeon HW, Jung SY, Lim JR, Pyun J, Kim H, Baek D, Joo YC Electrochemical and Solid State Letters, 15(5), H157, 2012 |