화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 Ultrathin Cr added Ru film as a seedless Cu diffusion barrier for advanced Cu interconnects
Hsu KC, Perng DC, Yeh JB, Wang YC
Applied Surface Science, 258(18), 7225, 2012
2 5 nm Amorphous Boron and Carbon Added Ru Film as a Highly Reliable Cu Diffusion Barrier
Perng DC, Yeh JB, Hsu KC, Wang YC
Electrochemical and Solid State Letters, 13(8), H290, 2010
3 Amorphous RuW Film as a Diffusion Barrier for Advanced Cu Metallization
Yeh JB, Perng DC, Hsu KC
Journal of the Electrochemical Society, 157(8), H810, 2010
4 Self-forming AlOx layer as Cu diffusion barrier on porous low-k film
Perng DC, Yeh JB, Hsu KC, Tsai SW
Thin Solid Films, 518(6), 1648, 2010
5 Ru/WCoCN as a seedless Cu barrier system for advanced Cu metallization
Perng DC, Yeh JB, Hsu KC
Applied Surface Science, 256(3), 688, 2009
6 Phosphorous doped Ru film for advanced Cu diffusion barriers
Perng DC, Yeh JB, Hsu KC
Applied Surface Science, 254(19), 6059, 2008