검색결과 : 1건
No. | Article |
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1 |
Electron Traps and Excess Current-Induced by Hot-Hole Injection into Thin SiO2-Films Kobayashi K, Teramoto A, Matsui Y, Hirayama M, Yasuoka A, Nakamura T Journal of the Electrochemical Society, 143(10), 3377, 1996 |
No. | Article |
---|---|
1 |
Electron Traps and Excess Current-Induced by Hot-Hole Injection into Thin SiO2-Films Kobayashi K, Teramoto A, Matsui Y, Hirayama M, Yasuoka A, Nakamura T Journal of the Electrochemical Society, 143(10), 3377, 1996 |