화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Trap States in Lead Iodide Perovskites
Wu XX, Trinh MT, Niesner D, Zhu HM, Norman Z, Owen JS, Yaffe O, Kudisch BJ, Zhu XY
Journal of the American Chemical Society, 137(5), 2089, 2015
2 Multiphonon Relaxation Slows Singlet Fission in Crystalline Hexacene
Busby E, Berkelbach TC, Kumar B, Chernikov A, Zhong Y, Hlaing H, Zhu XY, Heinz TF, Hybertsen MS, Sfeir MY, Reichman DR, Nuckolls C, Yaffe O
Journal of the American Chemical Society, 136(30), 10654, 2014
3 Substituent Variation Drives Metal/Monolayer/Semiconductor Junctions from Strongly Rectifying to Ohmic Behavior
Haj-Yahia A, Yaffe O, Bendikov T, Cohen H, Feldman Y, Vilan A, Cahen D
Advanced Materials, 25(5), 702, 2013
4 Mono-Fluorinated Alkyne-Derived SAMs on Oxide-Free Si(111) Surfaces: Preparation, Characterization and Tuning of the Si Workfunction
Pujari SP, van Andel E, Yaffe O, Cahen D, Weidner T, van Rijn CJM, Zuilhof H
Langmuir, 29(2), 570, 2013
5 Biographical Sketches
Li Y, Calder S, Yaffe O, Haick H, Kronik L, Cahen D, Zuilhof H
Langmuir, 28(26), 9907, 2012
6 Hybrids of Organic Molecules and Flat, Oxide-Free Silicon: High-Density Monolayers, Electronic Properties, and Functionalization
Li Y, Calder S, Yaffe O, Cahen D, Haick H, Kronik L, Zuilhof H
Langmuir, 28(26), 9920, 2012
7 Filled and empty states of alkanethiol monolayer on Au (111): Fermi level asymmetry and implications for electron transport
Qi YB, Yaffe O, Tirosh E, Vilan A, Cahen D, Kahn A
Chemical Physics Letters, 511(4-6), 344, 2011
8 Electronic Contact Deposition onto Organic Molecular Monolayers: Can We Detect Metal Penetration?
Shpaisman H, Har-Lavan R, Stein N, Yaffe O, Korobko R, Seitz O, Vilan A, Cahen D
Advanced Functional Materials, 20(13), 2181, 2010
9 Molecules on Si: Electronics with Chemistry
Vilan A, Yaffe O, Biller A, Salomon A, Kahn A, Cahen D
Advanced Materials, 22(2), 140, 2010
10 Interaction of Fe(III) Tetrakis(4-N-methylpyridinium)porphyrin with Sodium Dodecyl Sulfate at Submicellar Concentrations
Yaffe O, Korin E, Bettelheim A
Langmuir, 24(20), 11514, 2008