검색결과 : 23건
| No. | Article |
|---|---|
| 1 |
Energy performance enhancement of a research centre based on solar potential analysis and energy management Kichou S, Skandalos N, Wolf P Energy, 183, 1195, 2019 |
| 2 |
Isolated Zr Surface Sites on Silica Promote Hydrogenation of CO2 to CH3OH in Supported Cu Catalysts Lam E, Larmier K, Wolf P, Tada S, Safonova OV, Coperet C Journal of the American Chemical Society, 140(33), 10530, 2018 |
| 3 |
Analysis of the behaviour of cadmium telluride and crystalline silicon photovoltaic modules deployed outdoor under humid continental climate conditions Kichou S, Wolf P, Silvestre S, Chouder A Solar Energy, 171, 681, 2018 |
| 4 |
Identification of PV solar cells and modules parameters by combining statistical and analytical methods Wolf P, Benda V Solar Energy, 93, 151, 2013 |
| 5 |
A simple analytical model to study and control azimuthal instabilities in annular combustion chambers Parmentier JF, Salas P, Wolf P, Staffelbach G, Nicoud F, Poinso T Combustion and Flame, 159(7), 2374, 2012 |
| 6 |
Acoustic and Large Eddy Simulation studies of azimuthal modes in annular combustion chambers Wolf P, Staffelbach G, Gicquel LYM, Muller JD, Poinsot T Combustion and Flame, 159(11), 3398, 2012 |
| 7 |
Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy De Wolf P, Stephenson R, Trenkler T, Clarysse T, Hantschel T, Vandevorst W Journal of Vacuum Science & Technology B, 18(1), 361, 2000 |
| 8 |
Nonmonotonic behavior of the scanning capacitance microscope for large dynamic range samples Stephenson R, Verhulst A, De Wolf P, Caymax M, Vandervorst W Journal of Vacuum Science & Technology B, 18(1), 405, 2000 |
| 9 |
Evaluating probes for "electrical" atomic force microscopy Trenkler T, Hantschel T, Stephenson R, De Wolf P, Vandervorst W, Hellemans L, Malave A, Buchel D, Oesterschulze E, Kulisch W, Niedermann P, Sulzbach T, Ohlsson O Journal of Vacuum Science & Technology B, 18(1), 418, 2000 |
| 10 |
Comparison of two-dimensional carrier profiles in metal-oxide-semiconductor field-effect transistor structures obtained with scanning spreading resistance microscopy and inverse modeling De Wolf P, Vandervorst W, Smith H, Khalil N Journal of Vacuum Science & Technology B, 18(1), 540, 2000 |