| 1 |
The joys of research in retirement
Wittmaack K
Nature, 522(7555), 156, 2015 |
| 2 |
Secondary ion emission from polymer layers by atomic and molecular ion bombardment: Data evaluation based on linear-cascade sputtering theory
Wittmaack K
Applied Surface Science, 252(19), 6413, 2006 |
| 3 |
Miniature parallel-plate denuder for the collection of inorganic trace gases and their removal from aerosol-laden air
Keck L, Wittmaack K
Journal of Aerosol Science, 37(10), 1165, 2006 |
| 4 |
Towards a realistic description of the contribution of primary and secondary aerosols to ambient particle number and mass distributions
Wittmaack K
Journal of Aerosol Science, 35(5), 611, 2004 |
| 5 |
Apparent and real transient effects in SIMS depth profiling using oxygen bombardment
Wittmaack K
Applied Surface Science, 203, 20, 2003 |
| 6 |
Surface roughening of silicon under ultra-low-energy cesium bombardment
Kataoka Y, Yamazaki K, Shigeno M, Tada Y, Wittmaack K
Applied Surface Science, 203, 43, 2003 |
| 7 |
Ion-to-neutral conversion in time-of-flight secondary ion mass spectrometry
Szymczak W, Wittmaack K
Applied Surface Science, 203, 170, 2003 |
| 8 |
Detailed evaluation of the analytical resolution function
Wittmaack K
Applied Surface Science, 203, 268, 2003 |
| 9 |
Surprisingly large apparent profile shifts of As and Sb markers in Si bombarded with ultra-low-energy Cs ion beams
Kataoka Y, Shigeno M, Tada Y, Wittmaack K
Applied Surface Science, 203, 329, 2003 |
| 10 |
Advanced evaluation of size-differential distributions of aerosol particles
Wittmaack K
Journal of Aerosol Science, 33(7), 1009, 2002 |
