검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Roughness Determination of Plasma-Modified Surface-Layers with Atomic-Force Microscopy Almqvist N, Rubel M, Wienhold P, Fredriksson S Thin Solid Films, 270(1-2), 426, 1995 |
| No. | Article |
|---|---|
| 1 |
Roughness Determination of Plasma-Modified Surface-Layers with Atomic-Force Microscopy Almqvist N, Rubel M, Wienhold P, Fredriksson S Thin Solid Films, 270(1-2), 426, 1995 |