검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Toward Accurate Metrology with Scanning Force Microscopes Martin Y, Wickramasinghe HK Journal of Vacuum Science & Technology B, 13(6), 2335, 1995 |
| 2 |
Scanning Interferometric Apertureless Microscopy - Optical Imaging at 10 Angstrom Resolution Zenhausern F, Martin Y, Wickramasinghe HK Science, 269(5227), 1083, 1995 |