검색결과 : 18건
| No. | Article |
|---|---|
| 1 |
Imposition of defined states of stress on thin films by a wafer-curvature method; validation and application to aging Sn films Stein J, Pascher M, Welzel U, Huegel W, Mittemeijer EJ Thin Solid Films, 568, 52, 2014 |
| 2 |
In situ coherent X-ray diffraction of isolated core-shell nanowires Haag ST, Richard MI, Favre-Nicolin V, Welzel U, Jeurgens LPH, Ravy S, Richter G, Mittemeijer EJ, Thomas O Thin Solid Films, 530, 113, 2013 |
| 3 |
Synthesis of V-doped TiO2 films by chemical bath deposition and the effect of post-annealing on their properties Shopova-Gospodinova D, Jeurgens LPH, Welzel U, Bauermann LP, Hoffmann RC, Bill J Thin Solid Films, 520(18), 5928, 2012 |
| 4 |
Tailoring the stress-depth profile in thin films; the case of gamma'-Fe4N1-x Wohlschlogel M, Welzel U, Mittemeijer EJ Thin Solid Films, 520(1), 287, 2011 |
| 5 |
Mechanisms of interdiffusion in Pd-Cu thin film diffusion couples Chakraborty J, Welzel U, Mittemeijer EJ Thin Solid Films, 518(8), 2010, 2010 |
| 6 |
Aqueous deposition of ultraviolet luminescent columnar tin-doped indium hydroxide films Qiu Y, Bellina P, Jeurgens LPH, Leineweber A, Welzel U, Gerstel P, Jiang LQ, van Aken PA, Bill J, Aldinger F Advanced Functional Materials, 18(17), 2572, 2008 |
| 7 |
Interdiffusion and stress development in Cu-Pd thin film diffusion couples Kuru Y, Wohlschlogel M, Welzel U, Mittemeijer EJ Thin Solid Films, 516(21), 7615, 2008 |
| 8 |
Site-selective deposition of nanostructured ZnO thin films from solutions containing polyvinylpyrrolidone Lipowsky P, Hoffmann RC, Welzel U, Bill J, Aldinger F Advanced Functional Materials, 17(13), 2151, 2007 |
| 9 |
An X-ray diffraction method to determine stress at constant penetration/information depth Kumar A, Welzel U, Wohlschlogel M, Baumann W, Mittemeijer EJ Materials Science Forum, 524-525, 13, 2006 |
| 10 |
Mechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths Wohlschlogel M, Baumann W, Welzel U, Mittemeijer EJ Materials Science Forum, 524-525, 19, 2006 |