검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Interfacial analysis using time-of-flight medium energy backscattering Geil RD, Rogers BR, Song Z, Weller RA Journal of Vacuum Science & Technology A, 22(4), 1129, 2004 |
| 2 |
Characterization of platinum films deposited by focused ion beam-assisted chemical vapor deposition Telari KA, Rogers BR, Fang H, Shen L, Weller RA, Braski DN Journal of Vacuum Science & Technology B, 20(2), 590, 2002 |
| 3 |
Passivation of the 4H-SiC/SiO2 interface with nitric oxide Williams JR, Chung GY, Tin CC, McDonald K, Farmer D, Chanana RK, Weller RA, Pantelides ST, Holland OW, Das MK, Feldman LC Materials Science Forum, 389-3, 967, 2002 |
| 4 |
Atomic-scale engineering of the SiC-SiO2 interface Pantelides ST, Duscher G, Di Ventra M, Buczko R, McDonald K, Huang MB, Weller RA, Baumvol I, Stedile FC, Radtke C, Pennycook SJ, Chung G, Tin CC, Williams JR, Won JH, Feldman LC Materials Science Forum, 338-3, 1133, 2000 |