검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Prospects for SiGe thermoelectric generators Samarelli A, Llin LF, Cecchi S, Frigerio J, Chrastina D, Isella G, Gubler EM, Etzelstorfer T, Stangl J, Zhang Y, Weaver JMR, Dobson PS, Paul DJ Solid-State Electronics, 98, 70, 2014 |
| 2 |
Fabrication of sub-5 nm gaps between metallic electrodes using conventional lithographic techniques Steinmann P, Weaver JMR Journal of Vacuum Science & Technology B, 22(6), 3178, 2004 |
| 3 |
Direct imprint of sub-10 nm features into metal using diamond and SiC stamps Lister KA, Thoms S, Macintyre DS, Wilkinson CDW, Weaver JMR, Casey BG Journal of Vacuum Science & Technology B, 22(6), 3257, 2004 |
| 4 |
Fabrication of metallic tunnel junctions for the scanning single electron transistor atomic force microscope Steinmann P, Lister KA, Weaver JMR Journal of Vacuum Science & Technology B, 21(5), 2138, 2003 |
| 5 |
Scanning Hall probe microscopy on an atomic force microscope tip Chong BK, Zhou H, Mills G, Donaldson L, Weaver JMR Journal of Vacuum Science & Technology A, 19(4), 1769, 2001 |
| 6 |
Highly localized thermal, mechanical, and spectroscopic characterization of polymers using miniaturized thermal probes Hammiche A, Bozec L, Conroy M, Pollock HM, Mills G, Weaver JMR, Price DM, Reading M, Hourston DJ, Song M Journal of Vacuum Science & Technology B, 18(3), 1322, 2000 |
| 7 |
Lithographically defined nano and micro sensors using "float coating" of resist and electron beam lithography Zhou H, Chong BK, Stopford P, Mills G, Midha A, Donaldson L, Weaver JMR Journal of Vacuum Science & Technology B, 18(6), 3594, 2000 |
| 8 |
Recent progress in the functionalization of atomic force microscope probes using electron-beam nanolithography Zhou H, Mills G, Chong BK, Midha A, Donaldson L, Weaver JMR Journal of Vacuum Science & Technology A, 17(4), 2233, 1999 |
| 9 |
Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography Zhou H, Midha A, Bruchhaus L, Mills G, Donaldson L, Weaver JMR Journal of Vacuum Science & Technology B, 17(5), 1954, 1999 |
| 10 |
Generic scanned-probe microscope sensors by combined micromachining and electron-beam lithography Zhou H, Midha A, Mills G, Thoms S, Murad SK, Weaver JMR Journal of Vacuum Science & Technology B, 16(1), 54, 1998 |