검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Effect of mechanical treatment on the distribution of valence electrons and characteristics of nanocomposite (SiO2)(x)(Al2O3)(1-x) (x=0.8, x=0.7) electrodes in lithium power sources Zaulychnyy YV, Gunko VM, Yavorskyi YV, Gasyuk I, Wanderka N, Dudka OI Applied Surface Science, 494, 1013, 2019 |
| 2 |
Carbides in Co-Re-Cr-based high-temperature alloys Wanderka N, Mousa MS, Henke P, Korchuganova O, Mukherji D, Rosler J, Banhart J Journal of Materials Science, 51(15), 7145, 2016 |
| 3 |
Influence of oxides on the stability of zinc foam Chethan A, Garcia-Moreno F, Wanderka N, Murty BS, Banhart J Journal of Materials Science, 46(24), 7806, 2011 |
| 4 |
Capillary-driven assembly of ZnO nanowire arrays into micropatterns Tang Y, Zhao DX, Chen J, Wanderka N, Shen DZ, Fang F, Guo Z, Zhang JY, Wang XH Materials Chemistry and Physics, 121(3), 541, 2010 |
| 5 |
Optimisation of the strength of aluminium foam sandwich (AFS) panels by different heat treatments Shabestari SG, Wanderka N, Seeliger W, Banhart J Materials Science Forum, 519-521, 1221, 2006 |
| 6 |
Measurement of gamma/gamma' lattice mismatch in creep deformed single crystal superalloy SC16 using synchrotron X-radiation Chen W, Darowski N, Zizak I, Schumacher G, Klingelhoffer H, Wanderka N, Neumann W Materials Science Forum, 426-4, 4555, 2003 |
| 7 |
Formation of quasicrystals and crystallization sequence in the Zr46.8Ti8.2CU7.5Ni10Be27.5 bulk glass Macht MP, Mechler S, Muller M, Wanderka N Materials Science Forum, 386-3, 99, 2002 |
| 8 |
Dependence of magnetic properties, texture and residual stresses on the deposition parameters of CoFe - Single and multi layers Dieter S, Pyzalla A, Wanderka N, Seemann K, Reimers W Materials Science Forum, 404-7, 785, 2002 |
| 9 |
Electron microscopic characterization of microcrystalline silicon thin films deposited by ECR-CVD Sieber I, Wanderka N, Kaiser I, Fuhs W Thin Solid Films, 403-404, 543, 2002 |
| 10 |
Electron microscopic characterization of reactively sputtered ZnO films with different Al-doping levels Sieber I, Wanderka N, Urban I, Dorfel I, Schierhorn E, Fenske F, Fuhs W Thin Solid Films, 330(2), 108, 1998 |