| 1 |
First-principles study of the effect of Cr and Al on the oxidation resistance of WSi2
Wang SL, Pan Y, Lin YH
Chemical Physics Letters, 698, 211, 2018 |
| 2 |
Superior lithium storage of Si/WSi2 composite prepared via one step co-reduction of multi-phase oxide
Peng WJ, Guo HJ, Wang ZX, Li XH, Wang JX, Yan GC, Zhou Y
Journal of Electroanalytical Chemistry, 826, 84, 2018 |
| 3 |
Design, formation, and property of high emissivity WSi2-Si-glass hybrid coating on fibrous ZrO2 ceramic for reusable thermal protection system
Shao GF, Wu XD, Cui S, Jiao J, Shen XD
Solar Energy Materials and Solar Cells, 172, 301, 2017 |
| 4 |
Charge loss in WSi2 nanocrystals nonvolatile memory with SiO2/Si3N4/SiO2 tunnel layer
Lee DU, Lee HJ, Kim EK, You HW, Cho WJ
Current Applied Physics, 11(2), E6, 2011 |
| 5 |
Electrical properties of WSi2 nanocrystal memory with SiO2/Si3N4/SiO2 tunnel barriers
Seo KB, Lee DU, Han SJ, Kim EK, You HW, Cho WJ
Current Applied Physics, 10(1), E5, 2010 |
| 6 |
XTEM characterization of tungsten implanted SiC thin films on silicon for field emission devices
Lindner JKN, Tsang WM, Wong SP, Xu JB, Wilson IH
Thin Solid Films, 427(1-2), 417, 2003 |
| 7 |
Formation and Mechanism of Dimple/Pit on Si Substrate During WSix/Poly-Si Gate Stack Etch
Pan PH, Liu L
Journal of Vacuum Science & Technology B, 15(5), 1752, 1997 |
| 8 |
Ellipsometric Studies of Polycrystalline Molybdenum Silicide Thin-Films
Srinivas G, Vankar VD
Materials Research Bulletin, 31(11), 1331, 1996 |
| 9 |
Gate Oxide Degradation Caused by Anomalous Oxidation of Bf2 Ion-Implanted Mosi2 on Polycrystalline Silicon
Kato J, Takeuchi M, Tanaka K
Journal of the Electrochemical Society, 141(9), 2552, 1994 |
| 10 |
Chemically Vapor-Deposited Tungsten Silicide Films Using Dichlorosilane in a Single-Wafer Reactor - Growth, Properties, and Thermal-Stability
Telford SG, Eizenberg M, Chang M, Sinha AK, Gow TR
Journal of the Electrochemical Society, 140(12), 3689, 1993 |
