1 |
Microstructural properties of plasma-enhanced chemical vapor deposited WNx films using WF6-H-2-N-2 precursor system Kim SD Current Applied Physics, 7(4), 426, 2007 |
2 |
Tungsten nitride thin films deposited by MOCVD: sources of carbon and effects on film structure and stoichiometry Bchir OJ, Green KM, Hlad MS, Anderson TJ, Brooks BC, McElwee-White L Journal of Crystal Growth, 261(2-3), 280, 2004 |
3 |
Tungsten nitride films grown via pulsed laser deposition studied in situ by electron spectroscopies Soto G, de la Cruz W, Castillon FF, Diaz JA, Machorro R, Farias MH Applied Surface Science, 214(1-4), 58, 2003 |
4 |
Characterization of WF6/N-2/H-2 plasma enhanced chemical vapor deposited WxN films as barriers for Cu metallization Li H, Jin S, Bender H, Lanckmans F, Heyvaert I, Maex K, Froyen L Journal of Vacuum Science & Technology B, 18(1), 242, 2000 |
5 |
Thermal stability of selective chemical vapor deposited tungsten contact and effects of in situ N-2 plasma treatment Wang MT, Wang PC, Chuang MC, Chen LJ, Chen MC Journal of Vacuum Science & Technology B, 16(4), 2026, 1998 |