검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
An analytical expression for predicting wearout lifetime of thin gate and tunneling oxide Xu MZ, Tan CH Solid-State Electronics, 46(1), 115, 2002 |
| 2 |
The search for cathode and anode traps in high-voltage stressed silicon oxides Chen L, Kang CS, Oralkan O, Dumin DJ, Brown GA, Bellutti P Journal of the Electrochemical Society, 145(4), 1292, 1998 |