검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Dielectric function of Si nanocrystals embedded in SiO2 Gallas B, Kao CC, Defranoux C, Fisson S, Vuye G, Rivory J Thin Solid Films, 455-56, 335, 2004 |
| 2 |
Laser annealing of SiOx thin films Gallas B, Kao CC, Fisson S, Vuye G, Rivory J, Bernard Y, Belouet C Applied Surface Science, 185(3-4), 317, 2002 |
| 3 |
Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition Leprince-Wang Y, Souche D, Yu-Zhang K, Fisson S, Vuye G, Rivory J Thin Solid Films, 359(2), 171, 2000 |
| 4 |
Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity Brunet-Bruneau A, Fisson S, Gallas B, Vuye G, Rivory J Thin Solid Films, 377-378, 57, 2000 |
| 5 |
Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors Gallas B, Fisson S, Brunet-Bruneau A, Vuye G, Rivory J Thin Solid Films, 377-378, 62, 2000 |
| 6 |
Microstructural characterization of ion assisted SiO2 thin films by visible and infrared ellipsometry Brunet-Bruneau A, Souche D, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Journal of Vacuum Science & Technology A, 16(4), 2281, 1998 |
| 7 |
Visible and infrared ellipsometry study of ion assisted SiO2 films Souche D, Brunet-Bruneau A, Fisson S, Van VN, Vuye G, Abeles F, Rivory J Thin Solid Films, 313-314, 676, 1998 |
| 8 |
Initial-Stages in the Formation of PtSi on Si(111) as Followed by Photoemission and Spectroscopic Ellipsometry Ley L, Wang Y, Van VN, Fisson S, Souche D, Vuye G, Rivory J Thin Solid Films, 270(1-2), 561, 1995 |
| 9 |
Growth of Low and High Refractive-Index Dielectric Layers as Studied by in-Situ Ellipsometry Van VN, Fisson S, Frigerio JM, Rivory J, Vuye G, Wang Y, Abeles F Thin Solid Films, 253(1-2), 257, 1994 |