검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Dopant dose loss at the Si-SiO2 interface Vuong HH, Rafferty CS, Eshraghi SA, Ning J, McMacken JR, Chaudhry S, McKinley J, Stevie FA Journal of Vacuum Science & Technology B, 18(1), 428, 2000 |
| 2 |
Improvement in Molecular-Beam Epitaxy Machine Reliability Using Preventive Maintenance Ebert CW, Peticolas LJ, Reynolds CL, Vuong HH Journal of Vacuum Science & Technology B, 12(2), 616, 1994 |