검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Advanced electron microscopy needs for nanotechnology and nanomanufacturing Postek MT, Villarrubia JS, Vladar AE Journal of Vacuum Science & Technology B, 23(6), 3015, 2005 |
| 2 |
Scanned Probe Microscope Tip Characterization Without Calibrated Tip Characterizers Villarrubia JS Journal of Vacuum Science & Technology B, 14(2), 1518, 1996 |
| 3 |
Increasing the Value of Atomic-Force Microscopy Process Metrology Using a High-Accuracy Scanner, Tip Characterization, and Morphological Image-Analysis Schneir J, Villarrubia JS, Mcwaid TH, Tsai VW, Dixson R Journal of Vacuum Science & Technology B, 14(2), 1540, 1996 |