검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
White light interferometry for quantitative surface characterization in ion sputtering experiments Baryshev SV, Zinovev AV, Tripa CE, Erck RA, Veryovkin IV Applied Surface Science, 258(18), 6963, 2012 |
| 2 |
Sputtering of neutral clusters from silver-gold alloys King BV, Moore JF, Veryovkin IV, Zinovev AV, Pellin MJ Applied Surface Science, 256(4), 991, 2009 |
| 3 |
Sputtering of clusters from nickel-aluminium King BV, Moore JF, Calaway WF, Veryovkin IV, Pellin MJ Applied Surface Science, 252(19), 6426, 2006 |
| 4 |
7.87 eV postionization of peptides containing tryptophan or derivatized with fluorescein Hanley L, Edirisinghe PD, Calaway WF, Veryovkin IV, Pellin MJ, Moore JF Applied Surface Science, 252(19), 6723, 2006 |
| 5 |
Caesium sputter ion source compatible with commercial SIMS instruments Belykh SF, Palitsin V, Veryovkin IV, Kovarsky AP, Chang RJH, Adriaens A, Dowsett M, Adams F Applied Surface Science, 252(19), 7321, 2006 |
| 6 |
On the trends in kinetic energies of secondary ions produced by polyatomic ion bombardment Veryovkin IV, Belykh SF, Adriaens A, Zinovev AV, Adams F Applied Surface Science, 231-2, 101, 2004 |
| 7 |
A new horizon in secondary neutral mass spectrometry: post-ionization using a VUV free electron laser Veryovkin IV, Calaway WF, Moore JF, Pellin MJ, Lewellen JW, Li YL, Milton SV, King BV, Petravic M Applied Surface Science, 231-2, 962, 2004 |
| 8 |
Estimation of useful yield in surface analysis using single photon ionisation King BV, Pellin MJ, Moore JF, Veryovkin IV, Savina MR, Tripa CE Applied Surface Science, 203, 244, 2003 |