검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Depth profiling using C60+SIMS - Deposition and topography development during bombardment of silicon Gillen G, Batteas J, Michaels CA, Chi P, Small J, Windsor E, Fahey A, Verkouteren J, Kim KJ Applied Surface Science, 252(19), 6521, 2006 |
| 2 |
Automated analysis of organic particles using cluster SIMS Gillen G, Zeissler C, Mahoney C, Lindstrom A, Fletcher R, Chi P, Verkouteren J, Bright D, Lareau RT, Boldman M Applied Surface Science, 231-2, 186, 2004 |