검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Depth profiling by GDOES: application of hydrogen and d.c. bias voltage corrections to the analysis of thin oxide films Michler J, Aeberhard M, Velten D, Winter S, Payling R, Breme J Thin Solid Films, 447, 278, 2004 |
| No. | Article |
|---|---|
| 1 |
Depth profiling by GDOES: application of hydrogen and d.c. bias voltage corrections to the analysis of thin oxide films Michler J, Aeberhard M, Velten D, Winter S, Payling R, Breme J Thin Solid Films, 447, 278, 2004 |