검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Kelvin Probe Force Microscopy for Characterization of Semiconductor-Devices and Processes Tanimoto M, Vatel O Journal of Vacuum Science & Technology B, 14(2), 1547, 1996 |
| 2 |
Atomic-Force Microscopy Studies of Polysilicon Growth During Deposition on Silicon Vatel O, Andre E, Chollet F, Dumas P, Salvan F Journal of Vacuum Science & Technology B, 12(3), 2037, 1994 |