검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Broadband optical properties of aluminium zinc oxide thin films prepared by spatial atomic layer deposition Fullager DB, Boreman GD, Ellinger CD, Hofmann T Thin Solid Films, 653, 267, 2018 |
| 2 |
Optical characterization of epitaxial single crystal CdTe thin films on Al2O3 (0001) substrates Jovanovic SM, Devenyi GA, Jarvis VM, Meinander K, Haapamaki CM, Kuyanov P, Gerber M, LaPierre RR, Preston JS Thin Solid Films, 570, 155, 2014 |
| 3 |
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry Necas D, Ohlidal I, Franta D, Cudek V, Ohlidal M, Vodak J, Sladkova L, Zajickova L, Elias M, Vizd'a F Thin Solid Films, 571, 573, 2014 |
| 4 |
Influence of the graphene substrate on morphology of the gold thin film. Spectroscopic ellipsometry study Kostruba AM Applied Surface Science, 283, 603, 2013 |
| 5 |
Moderately high refractive index, low optical dispersion polymers with pendant diamondoids Robello DR Journal of Applied Polymer Science, 127(1), 96, 2013 |
| 6 |
Evaluation of thin metal film thickness from light attenuation and multi-reflection effects on micro-Raman response Camerlingo C, Lisitskiy MP, De Stefano L, Rea I, Delfino I, Lepore M Thin Solid Films, 536, 142, 2013 |
| 7 |
Ellipsometric characterisation of thin films non-uniform in thickness Necas D, Franta D, Bursikova V, Ohlidal I Thin Solid Films, 519(9), 2715, 2011 |
| 8 |
Investigation of Si/SiGe heterostructure material using non-destructive optical techniques Coonan BP, Griffin N, Beechinor JT, Murtagh M, Redmond G, Crean GM, Hollander B, Mantl S, Bozzo S, Lazzari JL, d'Avitaya FA, Derrien J, Paul DJ Thin Solid Films, 364(1-2), 75, 2000 |