화학공학소재연구정보센터
검색결과 : 15건
No. Article
1 Surface characterization and stability of an epoxy resin surface modified with polyamines grafted on polydopamine
Schaubroeck D, Vercammen Y, Van Vaeck L, Vanderleyden E, Dubruel P, Vanfleteren J
Applied Surface Science, 303, 465, 2014
2 Experimental study of the organic ion intensity distribution in the ion imaging of coated polymer fibres with S-SIMS
Vercammen Y, Moons N, Van Nuffel S, Beenaerts L, Van Vaeck L
Applied Surface Science, 284, 354, 2013
3 Surface Modification of a Photo-Definable Epoxy Resin with Polydopamine to Improve Adhesion with Electroless Deposited Copper
Schaubroeck D, Van Den Eeckhout E, De Baets J, Dubruel P, Van Vaeck L, Van Calster A
Journal of Adhesion Science and Technology, 26(18-19), 2301, 2012
4 Surface modification of an epoxy resin with polyamines via cyanuric chloride coupling
Schaubroeck D, De Baets J, Desmet T, Dubruel P, Schacht E, Van Vaeck L, Van Calster A
Applied Surface Science, 256(21), 6269, 2010
5 Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement
Heile A, Lipinsky D, Wehbe N, Delcorte A, Bertrand P, Felten A, Houssiau L, Pireaux JJ, De Mondt R, Van Vaeck L, Arlinghaus HF
Applied Surface Science, 255(4), 941, 2008
6 Synthesis and characterization of novel poly[(organo)phosphazenes] with cell-adhesive side groups
Heyde M, Moens M, Van Vaeck L, Shakesheff KM, Davies MC, Schacht EH
Biomacromolecules, 8(5), 1436, 2007
7 Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)
De Mondt R, Adriaensen L, Vangaever F, Lenaerts J, Van Vaeck L, Gijbels R
Applied Surface Science, 252(19), 6652, 2006
8 Static secondary ion mass spectrometry (S-SIMS) in advanced textile research: Study of additives in polypropylene (PP) films
Boschmans B, Vanneste M, Ruys L, Van Vaeck L
Applied Surface Science, 252(19), 6656, 2006
9 Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films
Boschmans B, Vanneste M, Ruys L, Temmerman E, Leys C, Van Vaeck L
Applied Surface Science, 252(19), 6660, 2006
10 Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)
Van Royen P, dos Santos AM, Schacht E, Ruys L, Van Vaeck L
Applied Surface Science, 252(19), 6992, 2006