검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Effects of flame-retardant additives on the manufacturing, mechanical, and fire properties of basalt fiber-reinforced polybenzoxazine Wolter N, Beber VC, Haubold T, Sandinge A, Blomqvist P, Goethals F, Van Hove M, Jubete E, Mayer B, Koschek K Polymer Engineering and Science, 61(2), 551, 2021 |
| 2 |
Analysis of slow de-trapping phenomena after a positive gate bias on AlGaN/GaN MIS-HEMTs with in-situ Si3N4/Al2O3 bilayer gate dielectrics Wu TL, Marcon D, Ronchi N, Bakeroot B, You SZ, Stoffels S, Van Hove M, Bisi D, Meneghini M, Groeseneken G, Decoutere S Solid-State Electronics, 103, 127, 2015 |
| 3 |
Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: Experimental data and numerical simulation Marino FA, Bisi D, Meneghini M, Verzellesi G, Zanoni E, Van Hove M, You S, Decoutere S, Marcon D, Stoffels S, Ronchi N, Meneghesso G Solid-State Electronics, 113, 9, 2015 |
| 4 |
Impurity incorporation during copper electrodeposition in the curvature-enhanced accelerator coverage regime Zhang W, Brongersma SH, Conard T, Wu W, Van Hove M, Vandervorst W, Maex K Electrochemical and Solid State Letters, 8(7), C95, 2005 |
| 5 |
Fabrication of 100 nm pitch copper interconnects by electron beam lithography Wu W, Jonckheere R, Tokei Z, Brongersma SH, Van Hove M, Maez K Journal of Vacuum Science & Technology B, 22(4), L11, 2004 |
| 6 |
Process optimization and integration of trimethylsilane-deposited alpha-SiC : H and alpha-SiCO : H dielectric thin films for damascene processing Gray WD, Loboda MJ, Bremmer JN, Struyf H, Lepage M, Van Hove M, Donaton RA, Sleeckx E, Stucchi M, Lanckmans F, Gao T, Boullart W, Coenegrachts B, Maenhoudt M, Vanhaelemeersch S, Meynen H, Maex K Journal of the Electrochemical Society, 150(7), G404, 2003 |
| 7 |
Low temperature oxidation and selective etching of chemical vapor deposition a-SiC : H films Baklanov MR, Van Hove M, Mannaert G, Vanhaelemeersch S, Bender H, Conard T, Maex K Journal of Vacuum Science & Technology B, 18(3), 1281, 2000 |