| 1 |
Study of the nucleation and growth of TiO2 and ZnO thin films by means of molecular dynamics simulations
Baguer N, Georgieva V, Calderin L, Todorov IT, Van Gils S, Bogaerts A
Journal of Crystal Growth, 311(16), 4034, 2009 |
| 2 |
Electropolishing of copper in H3PO4 - Ex situ and in situ optical characterization
Van Gils S, Le Pen C, Hubin A, Terryn H, Stijns E
Journal of the Electrochemical Society, 154(3), C175, 2007 |
| 3 |
Infrared and visible dielectric function of electroplated Bi-2 +/-xTe(3)+/- x films determined by spectroscopic ellipsometry
Zimmer A, Stein N, Johann L, Van Gils S, Terryn H, Stijns E, Boulanger C
Journal of the Electrochemical Society, 152(10), G772, 2005 |
| 4 |
In-situ characterisation of organosilane film formation on aluminium alloys by electrochemical quartz crystal microbalance and in-situ ellipsometry
Le Pen C, Vuillemin B, Van Gils S, Terryn H, Oltra R
Thin Solid Films, 483(1-2), 66, 2005 |
| 5 |
Spectroscopic ellipsometric characterization of an aqueous polyacrylic dispersion on steel
Goossens V, Van Gils S, De Strycker J, Finsy R, Terryn H
Thin Solid Films, 493(1-2), 35, 2005 |
| 6 |
Ageing of aluminium oxide surfaces and their subsequent reactivity towards bonding with organic functional groups
van den Brand J, Van Gils S, Beentjes PCJ, Terryn H, de Wit JHW
Applied Surface Science, 235(4), 465, 2004 |
| 7 |
Use of in-situ spectroscopic ellipsometry to study aluminium/oxide surface modifications in chloride and sulfuric solutions
Van Gils S, Melendres CA, Terryn H, Stijns E
Thin Solid Films, 455-56, 742, 2004 |
