검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Vapor sorption in thin supported polymer films studied by white light interferometry Manoli K, Goustouridis D, Chatzandroulis S, Raptis I, Valamontes ES, Sanopoulou M Polymer, 47(17), 6117, 2006 |
| 2 |
Surface roughness induced by plasma etching of Si-containing polymers Tserepi A, Gogolides E, Constantoudis V, Cordoyiannis G, Raptis I, Valamontes ES Journal of Adhesion Science and Technology, 17(8), 1083, 2003 |
| 3 |
Etching behavior of Si-containing polymers as resist materials for bilayer lithography: The case of poly-dimethyl siloxane Tserepi A, Cordoyiannis G, Patsis GP, Constantoudis V, Gogolides E, Valamontes ES, Eon D, Peignon MC, Cartry G, Cardinaud C, Turban G Journal of Vacuum Science & Technology B, 21(1), 174, 2003 |
| 4 |
Characterization and simulation of surface and line-edge roughness in photoresists Constandoudis V, Gogolides E, Patsis GP, Tserepi A, Valamontes ES Journal of Vacuum Science & Technology B, 19(6), 2694, 2001 |
| 5 |
Surface and line-edge roughness in solution and plasma developed negative tone resists: Experiment and simulation Patsis GP, Tserepi A, Raptis I, Glezos N, Gogolides E, Valamontes ES Journal of Vacuum Science & Technology B, 18(6), 3292, 2000 |
| 6 |
Simulation of roughness in chemically amplified resists using percolation theory Patsis GP, Glezos N, Raptis I, Valamontes ES Journal of Vacuum Science & Technology B, 17(6), 3367, 1999 |