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| No. | Article |
|---|---|
| 1 |
Thickness measurements of thin perfluoropolyether polymer films on silicon and amorphous-hydrogenated carbon with X-ray reflectivity, ESCA and optical ellipsometry Toney MF, Mate CM, Leach KA, Pocker D Journal of Colloid and Interface Science, 225(1), 219, 2000 |