검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Electron microscopic characterization of reactively sputtered ZnO films with different Al-doping levels Sieber I, Wanderka N, Urban I, Dorfel I, Schierhorn E, Fenske F, Fuhs W Thin Solid Films, 330(2), 108, 1998 |
| 2 |
Microscopic Characterization of Microcrystalline Silicon Thin-Films Sieber I, Urban I, Dorfel I, Koynov S, Schwarz R, Schmidt M Thin Solid Films, 276(1-2), 314, 1996 |