검색결과 : 1건
No. | Article |
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1 |
Uncertainty compensation methods for quantitative hardness measurement of materials using atomic force microscope nanoindentation technique Lee J, Kim CY, Joo M, Park K Thin Solid Films, 546, 448, 2013 |
No. | Article |
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1 |
Uncertainty compensation methods for quantitative hardness measurement of materials using atomic force microscope nanoindentation technique Lee J, Kim CY, Joo M, Park K Thin Solid Films, 546, 448, 2013 |