검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
TCAD simulation of tunneling leakage current in CaF2/Si(111) MIS structures Illarionov YY, Vexler MI, Karner M, Tyaginov SE, Cervenka J, Grasser T Current Applied Physics, 15(2), 78, 2015 |
| 2 |
Degradation effects in the one-band-tunneling Au/CaF2/n-Si(111) MIS structures Vexler MI, Suturin SM, Tyaginov SE, Banshchikov AG, Sokolov NS Thin Solid Films, 516(23), 8740, 2008 |
| 3 |
Statistical analysis of tunnel currents in scaled MOS structures with a non-uniform oxide thickness distribution Tyaginov SE, Vexler MI, Shulekin AF, Grekhov IV Solid-State Electronics, 49(7), 1192, 2005 |