화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Structure-property relationships from universal signatures of plasticity in disordered solids
Cubuk ED, Ivancic RJS, Schoenholz SS, Strickland DJ, Basu A, Davidson ZS, Fontaine J, Hor JL, Huang YR, Jiang Y, Keim NC, Koshigan KD, Lefever JA, Liu T, Ma XG, Magagnosc DJ, Morrow E, Ortiz CP, Rieser JM, Shavit A, Still T, Xu Y, Zhang Y, Nordstrom KN, Arratia PE, Carpick RW, Durian DJ, Fakhraai Z, Jerolmack DJ, Lee D, Li J, Riggleman R, Turner KT, Yodh AG, Gianola DS, Liu AJ
Science, 358(6366), 1033, 2017
2 Orthogonal Control of Stability and Tunable Dry Adhesion by Tailoring the Shape of Tapered Nanopillar Arrays
Cho Y, Kim G, Cho Y, Lee SY, Minsky H, Turner KT, Gianola DS, Yang S
Advanced Materials, 27(47), 7788, 2015
3 Facile Fabrication of Ordered Crystalline- Semiconductor Microstructures on Compliant Substrates
Cavallo F, Turner KT, Lagally MG
Advanced Functional Materials, 24(12), 1730, 2014
4 Simulated Adhesion between Realistic Hydrocarbon Materials: Effects of Composition, Roughness, and Contact Point
Ryan KE, Keating PL, Jacobs TDB, Grierson DS, Turner KT, Carpick RW, Harrison JA
Langmuir, 30(8), 2028, 2014
5 Effect of Inorganic Fillers in Paper on the Adhesion of Pressure-Sensitive Adhesives
Chen WX, Tang XY, Considine J, Turner KT
Journal of Adhesion Science and Technology, 25(6-7), 581, 2011
6 Impact of Wafer Geometry on CMP for Advanced Nodes
Vukkadala P, Turner KT, Sinha JK
Journal of the Electrochemical Society, 158(10), H1002, 2011
7 Methods to Measure the Strength of Cell Adhesion to Substrates
Christ KV, Turner KT
Journal of Adhesion Science and Technology, 24(13-14), 2027, 2010
8 Submicron aligned wafer bonding via capillary forces
Tupek MR, Turner KT
Journal of Vacuum Science & Technology B, 25(6), 1976, 2007
9 Analysis of Coulomb and Johnsen-Rahbek electrostatic chuck performance for extreme ultraviolet lithography
Sogard MR, Mikkelson AR, Nataraju M, Turner KT, Engelstad RL
Journal of Vacuum Science & Technology B, 25(6), 2155, 2007
10 Distortion of chucked extreme ultraviolet reticles from entrapped particles
Ramaswamy V, Engelstad RL, Turner KT, Mikkelson AR, Veeraraghavan S
Journal of Vacuum Science & Technology B, 24(6), 2829, 2006