검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Diffuse reflectance spectroscopy for in situ process monitoring and control during molecular beam epitaxy growth of InGaAs/AlGaAs pseudomorphic high electron mobility transistors Guyer JE, Tseng WF, Pellegrino JG Journal of Vacuum Science & Technology B, 18(5), 2518, 2000 |
| 2 |
Junction Locations by Scanning-Tunneling-Microscopy - In-Air-Ambient Investigation of Passivated GaAs PN Junctions Tseng WF, Dagata JA, Silver RM, Fu J, Lowney JR Journal of Vacuum Science & Technology B, 12(1), 373, 1994 |