| 1 |
Sensing performance of gas sensors fabricated from controllably grown ZnO-based nanorods on seed layers
Singh P, Simanjuntak FM, Wu YC, Kumar A, Zan HW, Tseng TY
Journal of Materials Science, 55(21), 8850, 2020 |
| 2 |
Porous carbon materials derived from areca palm leaves for high performance symmetrical solid-state supercapacitors
Le HA, Nguyen VT, Saho SK, Tseng TY, Wei KH
Journal of Materials Science, 55(24), 10751, 2020 |
| 3 |
Comparison and Elucidation of Structural Diversity and Variation of G-Rich Sequences with a Single G-Base Difference
Chu IT, Tseng TY, Chang TC
Journal of Physical Chemistry B, 123(26), 5423, 2019 |
| 4 |
Facile synthesis of mesoporous NiFe2O4/CNTs nanocomposite cathode material for high performance asymmetric pseudocapacitors
Kumar N, Kumar A, Huang GM, Wu WW, Tseng TY
Applied Surface Science, 433, 1100, 2018 |
| 5 |
The impact of TiW barrier layer thickness dependent transition from electro-chemical metallization memory to valence change memory in ZrO2-based resistive switching random access memory devices
Chandrasekaran S, Simanjuntak FM, Aluguri R, Tseng TY
Thin Solid Films, 660, 777, 2018 |
| 6 |
Resistive switching behavior of Ga doped ZnO-nanorods film conductive bridge random access memory
Singh P, Simanjuntak FM, Kumar A, Tseng TY
Thin Solid Films, 660, 828, 2018 |
| 7 |
Ternary Au/ZnO/rGO nanocomposites electrodes for high performance electrochemical storage devices
Chaudhary M, Doong RA, Kumar N, Tseng TY
Applied Surface Science, 420, 118, 2017 |
| 8 |
Endurance improvement and resistance stabilization of transparent multilayer resistance switching devices with oxygen deficient WOx layer and heat dissipating AlN buffer layer
Lin YH, Huang DC, Lou JC, Tseng TY
Thin Solid Films, 644, 10, 2017 |
| 9 |
Fabrication of carbon nanotube/cobalt oxide nanocomposites via electrophoretic deposition for supercapacitor electrodes
Kumar N, Yu YC, Lu YH, Tseng TY
Journal of Materials Science, 51(5), 2320, 2016 |
| 10 |
Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs
Lin CY, Chang TC, Liu KJ, Tsai JY, Chen CE, Liu HW, Lu YH, Tseng TY, Cheng O, Huang CT
Thin Solid Films, 620, 30, 2016 |
